Title:
Use of Atomic Force Microscopy and
Nanoindentation for Characterization of
Cemetitious Materials at the Nanoscale
Author(s):
P. Mondal, S.P. Shah, and L.D. Marks
Publication:
Symposium Paper
Volume:
254
Issue:
Appears on pages(s):
41-56
Keywords:
atomic force microscope; cement paste nanostructure; mechanical properties; nanoindentation
DOI:
10.14359/20210
Date:
10/1/2008
Abstract:
In this research, sample preparation techniques were developed to image
the nano- and microstructure of hardened cement paste and to determine local
mechanical properties. An atomic force microscope (AFM) was used to image the nanostructure of hardened cement paste. AFM and a Hysitron Triboindenter equipped with an in-situ scanning probe microscopy were used to determine the Young’s modulus of cement paste at the nanoscale.